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RFESP-75 40 N/m Cantilever Material: 0

SKU: 12727439503

4.1
USD285.47 USD312.47

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Description

Cantilever Material: 0

the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants

0 Front Angle: 15 ± 2

then probe model VITA-HE-NANOTA-200 is required instead

RFESP-75 40 N/m Cantilever Material: 03N m, 75kHz, Symmetric Tip, No Coatings, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingModeimaging and force modulation in air. Unmounted for use on standardAFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the

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